Complex impedance spectroscopy of manganese oxide thin films

Journal of Applied Physics

Volumn 107, Issue 2, 2010, Pages

  Lee, J H ^a   Chou, Hsiung ^a   Wen, G H ^b   Hwang, G H ^b  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b NATIONAL KAOHSIUNG NORMAL UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ANTIFERROMAGNETIC INSULATING PHASE; COMPLEX IMPEDANCE; COMPLEX IMPEDANCE SPECTROSCOPY; DIELECTRIC BEHAVIOR; EQUIVALENT CIRCUIT MODEL; FERROMAGNETIC METALLIC PHASE; HIGH-FREQUENCY PROPERTIES; INSULATING PHASE; MAGNETIC PHASE TRANSITIONS;

ANTIFERROMAGNETISM; CALCIUM; DIELECTRIC PROPERTIES; ELECTRIC IMPEDANCE MEASUREMENT; MANGANESE; MANGANESE OXIDE; OXIDE FILMS; THIN FILMS; TRANSPORT PROPERTIES;

PHASE TRANSITIONS;

EID: 75749125041     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3273319     Document Type: Article

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