Order versus disorder in chiral tetrathiafulvalene-oxazoline radical-cation salts: Structural and theoretical investigations and physical properties

Chemistry - A European Journal

Volumn 16, Issue 2, 2010, Pages 528-537

  Madalan, Augustin M ^a   Réthoré, Céline ^a   Fourmigué, Marc ^b   Canadell, Enric ^c   Lopes, Eisa B ^d   Almeida, Manuel ^d   Auban Senzier, Pascale ^e   Avarvari, Narcis ^a  

^a UNIVERSITÉ D'ANGERS   (France)

^b INSTITUT DES SCIENCES CHIMIQUES DE RENNES   (France)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

^d INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^e UNIVERSITÉ PARIS SUD   (France)

Author keywords

Chirality; Conducting materials; Density functional calcu lations; Mixed valent compounds; X ray diffraction

Indexed keywords

AVERAGE VALUES; BAND STRUCTURE CALCULATION; CELL PARAMETER; CENTROSYMMETRIC; CONDUCTING MATERIALS; CONDUCTIVITY MEASUREMENTS; CRYSTALLOGRAPHIC SITES; DENSITY FUNCTIONALS; DFT LEVELS; ELECTROCRYSTALLIZATION; ENANTIO; ENANTIOPURE; ENERGY MINIMA; MIXED VALENCE; MIXED-VALENT COMPOUNDS; MUTUAL ORIENTATION; NON-CENTROSYMMETRIC; OXAZOLINES; OXIDIZED STATE; QUASI-ONE-DIMENSIONAL; RADICAL-CATION SALTS; ROOM TEMPERATURE; S-TRANS; SHARP CONTRAST; SMALL ENERGY; SPACE GROUPS; STRUCTURAL DISORDERS; TEM; TETRATHIAFULVALENES; THEORETICAL INVESTIGATIONS;

CHIRALITY; CONFORMATIONS; CRYSTAL GROWTH; DIFFRACTION; ELECTRIC CONDUCTORS; ELECTRONIC STRUCTURE; ENANTIOMERS; NITROGEN COMPOUNDS; SINGLE CRYSTALS; STEREOCHEMISTRY; X RAY DIFFRACTION;

SALTS;

EID: 75649140891     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.200901980     Document Type: Article

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