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Materials Science Forum

Volumn 635, Issue , 2010, Pages 63-68

X-ray diffraction reciprocal space mapping study of modulated crystal structures in 10M Ni-Mn-Ga martensitic phase

(4) Ge, Yanling a Aaltio, Ilkka a Söderberg, Outi a Hannula, Simo Pekka a

a AALTO UNIVERSITY (Finland)

Author keywords

Ni Mn Ga; Reciprocal space mapping (RSM); X ray diffraction (XRD)

Indexed keywords

CRYSTAL STRUCTURE; FERROMAGNETIC MATERIALS; FERROMAGNETISM; MANGANESE ALLOYS; MAPPING; MODULATION; SHAPE-MEMORY ALLOY; TERNARY ALLOYS; X RAY DIFFRACTION;

EXPERIMENTAL PROCEDURE; MARTENSITIC PHASE; MODULATED CRYSTALS; MODULATION DOMAINS; NI-MN-GA; RECIPROCAL SPACE MAPPING; SCATTERING PLANE; SUPERLATTICE REFLECTIONS;

GALLIUM ALLOYS;

EID: 75649130816 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.635.63 Document Type: Conference Paper

Times cited : (3)

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