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Volumn 107, Issue 1, 2010, Pages

Propagation length of surface plasmon polaritons determined by emission from introduced surface discontinuities

Author keywords

[No Author keywords available]

Indexed keywords

BURIED WAVEGUIDE; CONSISTENT VALUES; FAR-FIELD; FINITE-ELEMENT; NANOHOLES; OHMIC LOSS; OXIDE THICKNESS; OXIDIZED SILICON WAFERS; PROPAGATION LENGTHS; RADIATIVE LOSS; STRIPE WAVEGUIDE; SURFACE DISCONTINUITIES; SURFACE PLASMON POLARITONS;

EID: 75649099359     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3273480     Document Type: Article
Times cited : (10)

References (25)
  • 3
    • 9144249834 scopus 로고    scopus 로고
    • 0935-9648. 10.1002/adma.200400271
    • E. Hutter and J. H. Fendler, Adv. Mater. 0935-9648 16, 1685 (2004). 10.1002/adma.200400271
    • (2004) Adv. Mater. , vol.16 , pp. 1685
    • Hutter, E.1    Fendler, J.H.2
  • 17
    • 24144490229 scopus 로고    scopus 로고
    • Channel plasmon-polariton guiding by subwavelength metal grooves
    • DOI 10.1103/PhysRevLett.95.046802, 046802
    • S. I. Bozhevolnyi, V. S. Volkov, E. Devaux, and T. W. Ebbesen, Phys. Rev. Lett. 0031-9007 95, 046802 (2005). 10.1103/PhysRevLett.95.046802 (Pubitemid 41506233)
    • (2005) Physical Review Letters , vol.95 , Issue.4 , pp. 1-4
    • Bozhevolnyi, S.I.1    Volkov, V.S.2    Devaux, E.3    Ebbesen, T.W.4
  • 18
    • 75649112375 scopus 로고    scopus 로고
    • note
    • Edge roughness was 5 nm peak to peak, mainly associated with grain structure (50-100 nm lateral grain extent), with occasional more slowly varying excursions of 50 to 100 nm over a 1 μm length of stripe, determined from scanning electron micrographs. Atomic force microscopy gave a rms surface roughness of 3 nm or less.
  • 21
    • 75649103673 scopus 로고    scopus 로고
    • COMSOL Inc., Burlington, MA.
    • COMSOL Inc., Burlington, MA.
  • 22


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.