Analysis of external occulters in the presence of defects

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7440, Issue , 2009, Pages

  Dumont, Philip ^a   Shaklan, Stuart ^a   Cady, Eric ^b   Kasdin, Jeremy ^b   Vanderbei, Robert ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b PRINCETON UNIVERSITY   (United States)

Author keywords

external occulter; finding; near field diffraction

Indexed keywords

DIFFRACTED FIELD; EARTH-LIKE PLANETS; ERROR BUDGETS; EXTERNAL OCCULTER; FINDING; HOST-STARS; MASK DEFECTS; MODELING DIFFRACTION; MONTE CARLO; NEAR-FIELD DIFFRACTION; NUMERICAL ALGORITHMS; OCCULTERS; ORDERS OF MAGNITUDE; PHYSICAL DIMENSIONS; RANDOM COMBINATION; RECTANGULAR APERTURE; SINC FUNCTION; SYSTEM CONTRAST;

BUDGET CONTROL; DIFFRACTION; INSTRUMENTS; MODELS;

DEFECTS;

EID: 75249083517     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.824633     Document Type: Conference Paper

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