Effect of annealing parameters on the shape memory properties of NiTi thin films

ICALEO 2008 - 27th International Congress on Applications of Lasers and Electro-Optics, Congress Proceedings

Volumn , Issue , 2008, Pages 100-109

  Satoh, Gen ^a   Birnbaum, Andrew ^a   Yao, Y Lawrence ^a  

^a Department of Earth and Environmental Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; BINARY ALLOYS; HEAT TREATMENT; TITANIUM ALLOYS;

EFFECT OF ANNEALING; EFFECTS OF HEAT TREATMENT; FUNCTIONALLY GRADED; NITI THIN FILMS; SHAPE-MEMORY PROPERTIES; SILICON SUBSTRATES; TEMPERATURE DEPENDENT; TRANSFORMATION TEMPERATURES;

THIN FILMS;

EID: 75149162827     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2351/1.5061436     Document Type: Conference Paper

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