On the nanostructure of Cu in TixCu1-x and TiN/Cu films: A XAFS study

Journal of Nano Research

Volumn 6, Issue , 2009, Pages 43-50

  Pinakidou, F ^a   Katsikini, M ^a   Patsalas, P ^b   Abadias, G ^c   Paloura, E C ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b UNIVERSITY OF IOANNINA   (Greece)

^c CNRS   (France)

Author keywords

EXAFS; NEXAFS; Short range order; TiCu films; TiN coatings

Indexed keywords

EXAFS; NEXAFS; SHORT RANGE ORDERS; SHORT-RANGE ORDER; TICU FILMS;

ABSORPTION SPECTROSCOPY; AMORPHOUS FILMS; COATINGS; TITANIUM NITRIDE;

COPPER;

EID: 74949106840     PISSN: 16625250     EISSN: 16619897     Source Type: Journal    
DOI: 10.4028/www.scientific.net/JNanoR.6.43     Document Type: Article

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