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Volumn 52, Issue 3, 2010, Pages 859-864
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Impedance investigation of thermally formed oxide films on AISI 304L stainless steel
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Author keywords
A. 304L stainless steel; Capacitance measurements; Mott Schottky plot; Thermally formed oxide films
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Indexed keywords
304L STAINLESS STEEL;
A. 304L STAINLESS STEEL;
AISI 304L STAINLESS STEEL;
APPLIED POTENTIALS;
CHROMIUM OXIDES;
DISORDERED SEMICONDUCTORS;
DOPING DENSITIES;
EXPOSURE-TIME;
INNER LAYER;
MOTT-SCHOTTKY PLOT;
MOTT-SCHOTTKY PLOTS;
MULTILAYER STRUCTURES;
OUTER LAYER;
OXYHYDROXIDES;
P-TYPE;
SEM;
STRUCTURAL CHARACTERIZATION;
THERMAL OXIDATION;
THIN OXIDE LAYERS;
ATOMIC FORCE MICROSCOPY;
CAPACITANCE;
CAPACITANCE MEASUREMENT;
CHROMIUM;
ELECTROCHEMICAL CORROSION;
ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY;
ELECTROCHEMICAL PROPERTIES;
ELECTRONIC PROPERTIES;
IRON;
IRON OXIDES;
MARTENSITIC STAINLESS STEEL;
MULTILAYER FILMS;
OXIDATION;
SCANNING ELECTRON MICROSCOPY;
STAINLESS STEEL;
OXIDE FILMS;
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EID: 74849124608
PISSN: 0010938X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.corsci.2009.11.004 Document Type: Article |
Times cited : (91)
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References (51)
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