Semiconducting and passive film properties of nitrogen-containing type 316LN stainless steels

Corrosion Science

Volumn 49, Issue 2, 2007, Pages 481-496

  Ningshen, S ^a   Kamachi Mudali, U ^a   Mittal, V K ^b   Khatak, H S ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b Water and Steam Chemistry Laboratory   (India)

Author keywords

A. Nitrogen steels; B. Polarization; C. Semiconducting; EIS; XPS

Indexed keywords

COMPOSITION; NITROGEN; PASSIVATION; POLARIZATION; SEMICONDUCTING FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

NITROGEN STEELS; PASSIVE FILMS; SEMICONDUCTING PARAMETERS;

STAINLESS STEEL;

COMPOSITION; NITROGEN; PASSIVATION; POLARIZATION; SEMICONDUCTING FILMS; STAINLESS STEEL; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33751522235     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.corsci.2006.05.041     Document Type: Article

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