Elemental analysis of silver coins by PIXE technique

Applied Radiation and Isotopes

Volumn 68, Issue 3, 2010, Pages 454-458

  Tripathy, B B ^a   Rautray, Tapash R ^b,c   Rautray, A C ^c   Vijayan, V ^d  

^a SILICON INSTITUTE OF TECHNOLOGY   (India)

^b Kyungpook National University   (South Korea)

^c ARASMIN   (India)

^d Praveen Institute of Radiation Technology   (India)

Author keywords

Non destructive; PIXE; Silver coins; Trace elements

Indexed keywords

ELEMENTAL ANALYSIS; ELEMENTAL CONCENTRATIONS; MAJOR ELEMENTS; MINOR ELEMENTS; NON DESTRUCTIVE; PIXE; PIXE TECHNIQUE; PROTON INDUCED X-RAY EMISSIONS; SILVER COINS; TRACE LEVEL;

CHROMIUM; EMISSION SPECTROSCOPY; LEAD; SILVER; TRACE ANALYSIS; ZINC;

TRACE ELEMENTS;

ARSENIC; CHROMIUM; COPPER; IRON; LEAD; NICKEL; SILVER; ZINC;

ANALYTIC METHOD; ARTICLE; CHEMICAL ANALYSIS; CONCENTRATION (PARAMETERS); MONEY; PHOTON INDUCED X RAY EMISSION SPECTROSCOPY; PRIORITY JOURNAL; SILVER COIN; SPECTROSCOPY;

EID: 74849117266     PISSN: 09698043     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apradiso.2009.12.031     Document Type: Article

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