Analysis of some coins by energy dispersive X-ray fluorescence (EDXRF) and high energy particle induced X-ray emission (PIXE) techniques

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 229, Issue 3-4, 2005, Pages 465-470

  Santra, S ^a   Mitra, D ^a   Sarkar, M ^a   Bhattacharya, D ^a   Denker, A ^b   Opitz Coutureau, J ^b   Rauschenberg, J ^b  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

Coin analysis; EDXRF; High energy PIXE

Indexed keywords

COPPER; ELECTRIC POTENTIAL; FLUORESCENCE; ITERATIVE METHODS; NEUTRON ACTIVATION ANALYSIS; NICKEL; PARAMETER ESTIMATION; PROTONS; TUNGSTEN; X RAY ANALYSIS;

COIN ANALYSIS; ENERGY DISPERSIVE X-RAY FLUORESCENCE (EDXRF); HIGH ENERGY PIXE; X-RAY FLUX;

HIGH ENERGY PHYSICS;

EID: 14544295351     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.125     Document Type: Article

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