Suppression of auger processes in confined structures

Nano Letters

Volumn 10, Issue 1, 2010, Pages 313-317

  Cragg, George E ^a   Efros, Alexander L ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Auger processes; Laser threshold; Nanocrystal blinking; Quantum dot; Quantum well; Quantum wire

Indexed keywords

AUGER DECAYS; AUGER PROCESS; CONFINED STRUCTURES; CONFINEMENT POTENTIAL; EFFECTIVE MASS; KANE MODEL; LASER THRESHOLD; MAGIC SIZE; NON-RADIATIVE; ORDERS OF MAGNITUDE; QUANTUM DOT QUANTUM WELL; QUANTUM WIRES; SIZE AND SHAPE;

AUGERS; DECAY (ORGANIC); NANOCRYSTALS; NANOWIRES; QUANTUM WELL LASERS; SEMICONDUCTOR QUANTUM DOTS; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; WIRE;

QUANTUM DOT LASERS;

NANOPARTICLE; QUANTUM DOT;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON; ELECTRONICS; FOURIER ANALYSIS; LASER; LIGHT; METHODOLOGY; NANOTECHNOLOGY; OSCILLOMETRY; STATISTICAL MODEL;

CRYSTALLIZATION; ELECTRONICS; ELECTRONS; FOURIER ANALYSIS; LASERS; LIGHT; MODELS, STATISTICAL; NANOPARTICLES; NANOTECHNOLOGY; OSCILLOMETRY; QUANTUM DOTS;

EID: 74849093746     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl903592h     Document Type: Article

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