SCOPUS 정보 검색 플랫폼

Journal of Non-Crystalline Solids

Volumn 356, Issue 4-5, 2010, Pages 281-285

Optical properties of CVD grown amorphous Ge-Sb-S thin films

(4) Huang, C C a Wu, C C b Knight, K a Hewak, D W a

a UNIVERSITY OF SOUTHAMPTON (United Kingdom)

b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE (Taiwan)

Author keywords

Chalcogenides; Chemical vapor deposition; Optical properties

Indexed keywords

AMORPHOUS THIN FILMS; ANTIMONY SULPHIDE; CHEMICAL VAPOUR DEPOSITION; COMMERCIAL GLASS; EXTRAPOLATION PROCEDURE; MICRO-RAMAN; OPTICAL TRANSMISSION SPECTRUM; S THIN FILMS; SCANNING ELECTRON MICROSCOPES; SWANEPOEL'S METHOD; UV-VIS-NIR SPECTROMETERS;

AMORPHOUS FILMS; ANTIMONY; APPROXIMATION THEORY; CHALCOGENIDES; DEPOSITION; GERMANIUM; LIGHT TRANSMISSION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; THIN FILMS;

CHEMICAL VAPOR DEPOSITION;

EID: 74549124410 PISSN: 00223093 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2009.12.027 Document Type: Article

Times cited : (21)

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