Oxygen isotopic measurements on the Cameca Nanosims 50

Applied Surface Science

Volumn 203-204, Issue , 2003, Pages 798-801

  Slodzian, G ^a   Hillion, F ^b   Stadermann, F J ^c   Horreard, F ^b  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b CAMECA   (United States)

^c WASHINGTON UNIVERSITY   (United States)

Author keywords

Electron multiplier; Isotopes; Oxygen; Silicon; SIMS

Indexed keywords

COMPUTER SIMULATION; ELECTRON MULTIPLIERS; OXYGEN; SECONDARY ION MASS SPECTROMETRY; SILICON;

PULSE HEIGHT DISTRIBUTIONS (PHD);

ISOTOPES;

EID: 7444238554     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00826-7     Document Type: Conference Paper

References (5)

1. G. Slodzian, B. Daigne, F. Girard, F. Hillion, A high resolution scanning ion microscope with parallel detection of secondary ions, in: Proceedings of the Eighth International SIMS Conference, Wiley, Chichester, 1991.
2. F. Hillion, B. Daigne, F. Girard, G. Slodzian, A new high performance instrument: the Cameca Nanosims 50, in: Proceedings of the Ninth International SIMS Conference, Wiley, Chichester, 1993.
3. F. Hillion, F. Horreard, F.J. Stadermann, Recent results and developments on the Cameca Nanosims 50, in: Proceedings of the 12th International SIMS Conference, Wiley, Chichester, 1999.
4. Slodzian G., Chaintreau M., Dennebouy R., Rousse G. Precise in situ measurements of isotopic abundances with pulse counting of sputtered ions. EPJ Appl. Phys. 14(3):2001;199.
5. A.D. Cutter, H.L. Hunter, R.W. Stresau, P.J.K. Paterson, in: Proceedings of 42nd ASMS Conference on Mass Spectrometry and Allied Topics, Chicago, IL, 1994.