A study of magnetic clusters in Co-doped ZnO using neutron scattering

Physica Status Solidi (B) Basic Research

Volumn 241, Issue 12, 2004, Pages 2858-2861

  Lee, Hyeon Jun ^a,b   Ryu, Gi Hun ^a   Kim, Sung Kyu ^c   Kim, Shin Ae ^c   Lee, Chang Hee ^c   Jeong, Se Young ^a,b   Cho, Chae Ryong ^d  

^a Pusan National University   (South Korea)

^b COMTECS Limited ^*  (South Korea)

^c Korea Atomic Energy Research Institute   (South Korea)

^d Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; DOPING (ADDITIVES); MAGNETIC FIELD EFFECTS; MATHEMATICAL MODELS; NEUTRON SCATTERING; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

CO-DOPING; MAGNETIC CLUSTERS; SECONDARY PHASES;

ZINC OXIDE;

EID: 7444227958     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssb.200405005     Document Type: Conference Paper

References (16)

1. H. Ohno, Science 281, 951 (1998).
2. H.-J. Lee, S.-Y. Jeong, J.-Y. Hwang, and C. R. Cho, Europhys. Lett. 64, 797 (2003).
3. S. W. Jung, S.-J. An, G.-C. Yi, C. U. Jung, S.-I. Lee, and S. Cho, Appl. Phys. Lett. 80, 4561 (2002).
4. H.-J. Lee, B.-S. Kim, C. R. Cho, and S.-Y. Jeong, phys. stat. sol. (b) 241, 1533 (2004).
5. K. Ueda, H. Tabata, and T. Kawai, Appl. Phys. Lett. 79, 988 (2001).
6. H.-J. Lee, S.-Y. Jeong, C. R. Cho, and C. H. Park, Appl. Phys. Lett. 81, 4020 (2002).
7. K. Rode, A. Anane, R. Mattana, J.-P. Contour, O. Durand, and R. LeBourgeois, J. Appl. Phys. 93, 7676 (2003).
8. W. Prellier, A. Fourchet, B. Mercey, Ch. Simon, and B. Raveau, Appl. Phys. Lett. 82, 3490 (2003).
9. K. Ando, H. Saito, Z. Jin, T. Fukumura, M. Kawasaki, Y. Matsumoto, and H. Koinuma, Appl. Phys. Lett. 78, 2700 (2001).
10. Z. Jin, T. Fukumura, M. Kawasaki, K. Ando, H. Saito, T. Sekiguchi, Y. Z. Yoo, M. Murakami, Y. Matsumoto, T. Hasegawa, and H. Koinuma, Appl. Phys. Lett. 78, 3824 (2001).
11. D. H. Kim, J. S. Yang, K. W. Lee, S. D. Bu, T. W. Noh, S.-J. Oh, Y.-W. Kim, J.-S. Chung, H. Tanaka, H. Y. Lee, and T. Kawai, Appl. Phys. Lett. 81, 2421 (2002).
12. H.-J. Lee, S.-Y. Jeong, C. R. Cho, S.-K. Kim, Y. N. Choi, and C.-H. Lee, Europhys. Lett. (2004) (submitted).
13. B. D. Cullity, Elements of X-ray diffraction (Addison-Wesley Publishing Company, Inc., 1976), p. 111.
14. H. P. Klug, X-ray diffraction procedures (Wiley-Interscience, Canada, 1974), p. 798.
15. J. K. Furdyna, J. Appl. Phys. 64, R29 (1988).
16. R. A. Young, The Rietveld Method (Oxford University Press, New York, 1993), p. 22.