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Volumn 193, Issue , 2009, Pages

Current transport modeling and experimental study of THz room temperature ballistic deflection transistors

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EID: 74349121603     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/193/1/012092     Document Type: Conference Paper
Times cited : (8)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.