Incorporating ANNs and statistical techniques into achieving process analysis in TFT-LCD manufacturing industry

Robotics and Computer-Integrated Manufacturing

Volumn 26, Issue 1, 2010, Pages 92-99

  Hsieh, Kun Lin ^a  

^a NATIONAL TAITUNG UNIVERSITY   (Taiwan)

Author keywords

Artificial neural networks (ANNs); Liquid crystal displays (LCDs); Manufacturing intelligence; Process analysis; Stepwise regression

Indexed keywords

ARTIFICIAL NEURAL NETWORKS; ARTIFICIAL NEURAL NETWORKS (ANNS); CLUSTERING ANALYSIS; CLUSTERING EFFECT; DATA MINING TECHNIQUES; DOMAIN KNOWLEDGE; EFFECT ANALYSIS; ILLUSTRATIVE CASE; MANUFACTURING PROCESS; PARAMETER EFFECTS; PROCESS ANALYSIS; SCIENCE PARK; STATISTICAL TECHNIQUES; STEPWISE REGRESSION; TFT-LCD INDUSTRY; TFT-LCD MANUFACTURING; TFT-LCDS; YIELD LOSS;

CLUSTER ANALYSIS; COMPETITION; DATA MINING; INDUSTRIAL ENGINEERING; LIQUID CRYSTALS; MANUFACTURE; NEURAL NETWORKS; PLANNING; PRODUCTION ENGINEERING; REGRESSION ANALYSIS; THIN FILM TRANSISTORS;

LIQUID CRYSTAL DISPLAYS;

EID: 74249086185     PISSN: 07365845     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.rcim.2009.04.019     Document Type: Article

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