Structural, compositional and magnetic characterization of bulk V 2 O 5 doped ZnO system

Applied Surface Science

Volumn 256, Issue 8, 2010, Pages 2309-2314

  Karamat, S ^a   Rawat, R S ^a   Lee, P ^a   Tan, T L ^a   Ramanujan, R V ^b   Zhou, W ^c  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Raman spectroscopy; V doped ZnO; XPS

Indexed keywords

FERROMAGNETISM; IONS; RAMAN SPECTROSCOPY; RIETVELD REFINEMENT; SOLID STATE REACTIONS; VANADIUM PENTOXIDE; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDE; ZINC SULFIDE;

FERROMAGNETIC BEHAVIORS; ION SUBSTITUTION; MAGNETIC CHARACTERIZATION; SOLID-STATE REACTION TECHNIQUES; V-DOPED ZNO; VANADIUM OXIDES; WEAK FERROMAGNETISM; WURTZITE STRUCTURE;

II-VI SEMICONDUCTORS;

EID: 74149093606     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.09.039     Document Type: Article

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