![]() |
Volumn 405, Issue 4, 2010, Pages 1139-1149
|
Bandgap changes in excited intrinsic (heavily doped) Si and Ge semiconductors
|
Author keywords
Bandgap narrowing; Electrical bandgap; Fermi energy; Ge; Intrinsic bandgap; Optical bandgap; Si; SiGe
|
Indexed keywords
ENERGY GAP;
FERMI LEVEL;
GERMANIUM;
OPTICAL BAND GAPS;
OPTICAL DATA PROCESSING;
POTENTIAL ENERGY;
SEMICONDUCTING SILICON;
SILICON;
BAND GAP NARROWING;
CARRIER-CARRIER INTERACTION;
ELECTRON HOLE;
FERMI-DIRAC STATISTICS;
MAJORITY CARRIERS;
OPTICAL MEASUREMENT;
SCREENING EFFECT;
SIGE;
SI-GE ALLOYS;
|
EID: 74149083164
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/j.physb.2009.11.016 Document Type: Article |
Times cited : (5)
|
References (37)
|