Electromagnetic properties of nanometer SiC/CNTs composite

Advanced Materials Research

Volumn 79-82, Issue , 2009, Pages 349-352

  Yao, Jianxun ^a   Wang, Liuying ^a,b   Liu, Gu ^a   Hua, Shaochun ^a  

^a XI'AN RESEARCH INSTITUTE OF HIGH TECHNOLOGY   (China)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

CNTs; Electromagnetic parameters; Microwave absorption properties; SiC

Indexed keywords

COMPLEX PERMITTIVITY; ELECTROMAGNETIC PARAMETERS; ELECTROMAGNETIC PROPERTIES; HEWLETT-PACKARD; LOW FREQUENCY RANGE; MASS FRACTION; MICROWAVE ABSORPTION; MICROWAVE ABSORPTION PROPERTIES; NETWORK ANALYZER; REFLECTION CURVES; REFLECTION LOSS;

ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC WAVES; ELECTROMAGNETISM; FUNCTIONAL MATERIALS; MICROWAVES; PERMITTIVITY; REFLECTION; SILICON CARBIDE; WAVE TRANSMISSION;

ABSORPTION;

EID: 74049131577     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.79-82.349     Document Type: Conference Paper

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