Quantitative characterization of the interface between a V 2O3 layer and Cu3Au (001) by Cs corrected HREM

Materials Research Society Symposium Proceedings

Volumn 1184, Issue , 2009, Pages 203-208

  Calderon, H A ^a   Niehus, H ^b,c,d   Freitag, B ^e   Wall, D ^e   Stavale, F ^c,d   Achete, C A ^c,d  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b HUMBOLDT UNIVERSITY   (Germany)

^c INSTITUTO NACIONAL DE METROLOGIA   (Brazil)

^d FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^e Thermo Fisher Scientific   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CHEMICAL BONDS; CORUNDUM; CRYSTALLOGRAPHY; ELECTRONIC STRUCTURE; HIGH RESOLUTION ELECTRON MICROSCOPY; NANOSTRUCTURED MATERIALS; VANADIUM COMPOUNDS;

CATALYTIC PROPERTIES; CHEMICAL COMPOSITIONS; CORUNDUM STRUCTURES; FOCAL SERIES RECONSTRUCTION; INCOHERENT INTERFACES; INTERFACIAL BONDING; QUANTITATIVE CHARACTERIZATION; QUANTITATIVE RESULT;

CESIUM;

EID: 74049120124     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1184-hh08-10     Document Type: Conference Paper

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