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Volumn 602, Issue 11, 2008, Pages

Atomically resolved interface structure of a vanadium sesquioxide(0 0 0 1) film grown on Cu3Au(0 0 1)

Author keywords

High resolution transmission electron microscopy; Metal oxide interface; Thin oxide films; Vanadium oxide

Indexed keywords

ABERRATIONS; FILM GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALLIC FILMS; MONOLAYERS; TWO DIMENSIONAL;

EID: 44649178515     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.04.006     Document Type: Article
Times cited : (11)

References (26)
  • 2
    • 0004289926 scopus 로고    scopus 로고
    • Amelincks S., Van Dyck D., van Landuyt J., and van Tendeloo G. (Eds), VCH, Weinheim
    • Rühle M. In: Amelincks S., Van Dyck D., van Landuyt J., and van Tendeloo G. (Eds). Handbook of Microscopy: Applications (1997), VCH, Weinheim
    • (1997) Handbook of Microscopy: Applications
    • Rühle, M.1
  • 26
    • 44649155222 scopus 로고    scopus 로고
    • Rodrigo B. Capaz et al., in preparation.
    • Rodrigo B. Capaz et al., in preparation.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.