Measurement of rapid temperature profiles using thermoluminescent microparticles

IEEE Sensors Journal

Volumn 10, Issue 2, 2010, Pages 311-315

  Mah, Merlin L ^a   Manfred, Michael E ^b,c   Kim, Sangho S ^a   Prokić, Mirjana ^d   Yukihara, Eduardo G ^e   Talghader, Joseph J ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c HONEYWELL   (United States)

^d UNIVERSITY OF BELGRADE   (Serbia)

^e OKLAHOMA STATE UNIVERSITY   (United States)

Author keywords

Microelectromechanical devices; Temperature measurement; Thermal history; Thermoluminescence (TL)

Indexed keywords

AVERAGE ERRORS; CO PARTICLES; FIRST ORDER KINETICS; INTENSITY RATIO; MAXIMUM TEMPERATURE; MICRO-PARTICLES; MICROMACHINED; ON TIME; RAPID TEMPERATURE; SENSING TEMPERATURE; THERMAL HISTORY; TRAP STATE;

LIGHT EMISSION; MICROELECTROMECHANICAL DEVICES; SILICON COMPOUNDS; TEMPERATURE MEASUREMENT;

THERMOLUMINESCENCE;

EID: 73849099357     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2009.2034023     Document Type: Article

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