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Volumn 62, Issue 2, 2010, Pages 63-66
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Coexistence of anion and cation vacancy defects in vacuum-annealed In2O3 thin films
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Author keywords
Crystal defects; HRTEM; Magnetic semiconductors; RBS; Sputtering
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Indexed keywords
CATION VACANCIES;
CRYSTALLINE DEFECTS;
FERROMAGNETIC THIN FILMS;
HIGH CONDUCTIVITY;
HIGH-RESOLUTION MICROSCOPY;
HRTEM;
IN-VACUUM;
OXYGEN DEFICIENT;
ROOM-TEMPERATURE FERROMAGNETISM;
STRUCTURAL DEFECT;
SURFACE LAYERS;
FERROMAGNETIC MATERIALS;
FERROMAGNETISM;
MAGNETIC SEMICONDUCTORS;
OXYGEN;
THIN FILMS;
VACANCIES;
VACUUM;
DEFECTS;
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EID: 73649149047
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2009.10.001 Document Type: Article |
Times cited : (25)
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References (28)
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