Simultaneous composition and thickness measurement of paper using terahertz time-domain spectroscopy

Applied Optics

Volumn 48, Issue 33, 2009, Pages 6541-6546

  Mousavi, Payam ^a   Haran, Frank ^b   Jez, David ^b   Santosa, Fadil ^c   Dodge, John Steven ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

^b HONEYWELL   (United States)

^c University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTELLIGENT SYSTEMS; MONTE CARLO METHODS; PLASMONS; REFLECTOMETERS; SPECTROPHOTOMETERS; TERAHERTZ SPECTROSCOPY; THICKNESS MEASUREMENT;

EFFECTIVE MEDIUM; MODEL PARAMETERS; NONCONTACT METHODS; SENSOR TECHNOLOGIES; SIMULTANEOUS MEASUREMENT; TERAHERTZ TIME DOMAIN SPECTROSCOPY; THICKNESS MONITORING; TRANSMISSION AMPLITUDE;

TIME DOMAIN ANALYSIS;

COMPUTERS; MEASUREMENT; PAPER; PHOTOMETERS; REFLECTOMETERS; SHEETING; SIMULATION; SPECTROMETERS; THICKNESS;

EID: 73649139205     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.006541     Document Type: Article

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