Development of dual PZT transducers for reference-free crack detection in thin plate structures

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 57, Issue 1, 2010, Pages 229-240

  Sohn, Hoon ^a   Kim, Seuno Bum ^b  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM PLATES; BASELINE DATA; CRACK FORMATION; CRACK MONITORING; CURRENT DATA; DAMAGE CLASSIFICATION; EXTERNAL LOADING; LAMB WAVE; LAMB WAVE MODE; LEAD ZIRCONATE TITANATE; MEASURED DATA; NEW DESIGN; NON DESTRUCTIVE TESTING; NUMERICAL SIMULATION; PLATE STRUCTURE; PZT TRANSDUCERS; STATISTICAL APPROACH; STRUCTURAL DEFECT; TEMPERATURE VARIATION; THIN PLATE STRUCTURE;

CLASSIFICATION (OF INFORMATION); COMPUTER SIMULATION; CRACK DETECTION; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; PLATES (STRUCTURAL COMPONENTS); SEMICONDUCTING LEAD COMPOUNDS; SULFUR COMPOUNDS; SURFACE STRUCTURE; ULTRASONIC WAVES;

NONDESTRUCTIVE EXAMINATION;

LEAD; LEAD TITANATE ZIRCONATE; TITANIUM; ZIRCONIUM;

ARTICLE; ARTIFICIAL MEMBRANE; COMPUTER AIDED DESIGN; ECHOGRAPHY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LEAD; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TITANIUM; TRANSDUCERS; ULTRASONOGRAPHY; ZIRCONIUM;

EID: 73649118523     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2010.1401     Document Type: Conference Paper

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