Simple and accurate expressions for diffuse reflectance of semi-infinite and two-layer absorbing and scattering media

Applied Optics

Volumn 48, Issue 35, 2009, Pages 6670-6683

  Yudovsky, Dmitry ^a   Pilon, Laurent ^a  

^a University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC MEDIA; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; REFLECTION; REFRACTION; REFRACTIVE INDEX;

ABSORPTION AND SCATTERINGS; COMPUTATIONALLY EFFICIENT; DIFFUSE REFLECTANCE SPECTROSCOPY; NON-INVASIVE DIAGNOSIS; OPTICAL SOCIETY OF AMERICA; SEMI-EMPIRICAL PARAMETERS; SINGLE SCATTERING ALBEDO; TWO-FLUX APPROXIMATIONS;

FORWARD SCATTERING;

ABSORPTION; ANISOTROPY; ARTICLE; LIGHT; OPTICS; RADIATION SCATTERING; THEORETICAL MODEL;

ABSORPTION; ANISOTROPY; LIGHT; MODELS, THEORETICAL; OPTICS AND PHOTONICS; SCATTERING, RADIATION;

EID: 73649109220     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.48.006670     Document Type: Article

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