Properties of Au nanolayer sputtered on polyethyleneterephthalate

Materials Letters

Volumn 64, Issue 5, 2010, Pages 611-613

  Svorcik V ^a   Kolska Z ^b   Luxbacher, T ^c   Mistrik J ^d  

^a INSTITUTE OF CHEMICAL TECHNOLOGY   (Czech Republic)

^b J E PURKINJE UNIVERSITY   (Czech Republic)

^c ANTON PAAR GMBH   (Austria)

^d UNIVERSITY OF PARDUBICE   (Czech Republic)

Author keywords

Au sputtered layer; Crystallic structure; Optical and surface properties; Polyethyleneterephthalate

Indexed keywords

AFM; AU FILM; AU SPUTTERED LAYER; CRYSTALLIC STRUCTURE; LATTICE PARAMETERS; LATTICE STRESS; LAYER THICKNESS; NANO LAYERS; POTENTIAL MEASUREMENTS; SPUTTERED LAYERS; SURFACE CONDUCTANCE; XRD; XRD MEASUREMENTS;

ATOMIC FORCE MICROSCOPY; OPTICAL PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY; SURFACE MORPHOLOGY; SURFACE PROPERTIES; TRACE ANALYSIS; X RAY DIFFRACTION;

GOLD;

EID: 73649100913     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2009.12.018     Document Type: Article

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