|
Volumn 62, Issue 6, 2010, Pages 379-382
|
Interfacial defect structure at Sb2Te3 precipitates in the thermoelectric compound AgSbTe2
|
Author keywords
High resolution electron microscopy (HREM); Interfaces; Phase transformations; Precipitation; Thermoelectric materials
|
Indexed keywords
ATOMIC FLUXES;
DEFECT MOTION;
GROWTH MECHANISMS;
INTERFACIAL DEFECT;
LINE DEFECTS;
PHASE TRANSFORMATION;
ROCK SALT;
ROCK-SALT STRUCTURE;
STEP-HEIGHT;
THERMOELECTRIC COMPOUND;
THERMOELECTRIC MATERIAL;
CHALCOGENIDES;
DEFECT STRUCTURES;
PHASE INTERFACES;
PHASE TRANSITIONS;
TELLURIUM COMPOUNDS;
THERMOELECTRIC EQUIPMENT;
THERMOELECTRICITY;
HIGH RESOLUTION ELECTRON MICROSCOPY;
|
EID: 73549085438
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2009.11.028 Document Type: Article |
Times cited : (27)
|
References (25)
|