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Volumn 62, Issue 6, 2010, Pages 379-382

Interfacial defect structure at Sb2Te3 precipitates in the thermoelectric compound AgSbTe2

Author keywords

High resolution electron microscopy (HREM); Interfaces; Phase transformations; Precipitation; Thermoelectric materials

Indexed keywords

ATOMIC FLUXES; DEFECT MOTION; GROWTH MECHANISMS; INTERFACIAL DEFECT; LINE DEFECTS; PHASE TRANSFORMATION; ROCK SALT; ROCK-SALT STRUCTURE; STEP-HEIGHT; THERMOELECTRIC COMPOUND; THERMOELECTRIC MATERIAL;

EID: 73549085438     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2009.11.028     Document Type: Article
Times cited : (27)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.