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Volumn 190, Issue , 2009, Pages
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Copper defects inside AlN:Cu nanorods - XANES and LAPW study
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 73449148697
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/190/1/012136 Document Type: Conference Paper |
Times cited : (11)
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References (17)
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