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Journal of Synchrotron Radiation

Volumn 17, Issue 1, 2010, Pages 81-85

Synchrotron infrared reflectance micro-spectroscopy study of film formation and breakdown on copper

(2) Hahn, F a Melendres, C A b

a UNIVERSITÉ DE POITIERS (France)

b SHD Institute (United States)

Author keywords

Copper corrosion in bicarbonate; Film formation and breakdown; Infrared microspectroscopy; Pitting

Indexed keywords

AG/AGCL; ANODIC FILMS; BACK-REFLECTION GEOMETRY; BICARBONATE SOLUTION; COPPER CARBONATE; FILM FORMATIONS; GENERAL CORROSION; INFRARED MICRO-SPECTROSCOPY; INFRARED REFLECTANCE; LOCALIZED CORROSION; MICRO SPECTROSCOPY; NAOH SOLUTIONS; PASSIVE FILMS; SURFACE FILMS;

ALUMINUM CORROSION; CARBONATE MINERALS; COPPER CORROSION; INFRARED SPECTROSCOPY; MICROOPTICS; PITTING; REFLECTION; SYNCHROTRONS;

COPPER;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; INFRARED SPECTROPHOTOMETRY; MATERIALS TESTING; METHODOLOGY; OXIDATION REDUCTION REACTION; SYNCHROTRON;

COPPER; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; OXIDATION-REDUCTION; SPECTROPHOTOMETRY, INFRARED; SYNCHROTRONS;

EID: 73449136844 PISSN: 09090495 EISSN: 16005775 Source Type: Journal
DOI: 10.1107/S0909049509040680 Document Type: Article

Times cited : (3)

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