In situ synchrotron far-infrared spectromicroscopy of a copper electrode at grazing incidence angle

Journal of Synchrotron Radiation

Volumn 14, Issue 5, 2007, Pages 446-448

  Hahn, F ^a   Mathis, Y L ^b   Bonnefont, A ^c   Maillard, F ^d   Melendres, C A ^e  

^a UNIVERSITÉ DE POITIERS   (France)

^b KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

^c UNIVERSITÉ LOUIS PASTEUR   (France)

^d GRENOBLE INSTITUTE OF TECHNOLOGY   (France)

^e SHD Institute   (United States)

Author keywords

Electrochemistry; Far infrared spectromicroscopy; Oxide film on copper

Indexed keywords

COPPER; OXIDE FILMS; SODIUM COMPOUNDS; SPECTROELECTROCHEMISTRY; SYNCHROTRON RADIATION; THERMODYNAMICS;

FAR-INFRARED SPECTROMICROSCOPY; GRAZING INCIDENCE ANGLE; IN SITU SPECTRA; MYLAR WINDOW;

ELECTRODES;

EID: 34548247131     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049507029809     Document Type: Article

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