Effect of BiFeO3 additions on the dielectric and piezoelectric properties of (K0.44Na0.52Li0.04)(Nb0.84Ta0.1Sb0.06)O3 ceramics

Materials Research Bulletin

Volumn 45, Issue 2, 2010, Pages 220-223

  Jiang, Minhong ^a,b   Liu, Xinyu ^a,b   Liu, Chaoying ^b  

^a GUILIN UNIVERSITY OF ELECTRONIC TECHNOLOGY   (China)

^b CENTRAL SOUTH UNIVERSITY   (China)

Author keywords

A. Ceramics; B. Chemical synthesis; B. X ray diffraction; D. Piezoelectricity

Indexed keywords

B. CHEMICAL SYNTHESIS; CERAMIC PROCESSING; CHEMICAL SYNTHESIS; COMPOSITION RANGES; COMPOSITIONAL DEPENDENCE; DIELECTRIC AND PIEZOELECTRIC PROPERTIES; ELECTRICAL PROPERTY; LEAD-FREE PIEZOELECTRIC CERAMIC; LEAD-FREE PIEZOELECTRIC MATERIALS; MORPHOTROPIC PHASE BOUNDARIES; PIEZOELECTRIC PROPERTY; TETRAGONAL PHASIS;

CRYSTALLOGRAPHY; DIFFRACTION; ELECTRIC PROPERTIES; FERROELECTRIC CERAMICS; PIEZOELECTRIC CERAMICS; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; SODIUM; TANTALUM; X RAY DIFFRACTION;

SYNTHESIS (CHEMICAL);

EID: 73449131143     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2009.09.014     Document Type: Article

References (19)

1. Egerton L., and Dillon D.M. J. Am. Ceram. Soc. 42 (1959) 438
2. Wu L., Xiaoo D.Q., Wu J.G., Yong S., Lin D.M., Zhu J.G., Yu P., Zhuang Y., and WWI Q. J. Eur. Ceram. Soc. 28 (2008) 2963
3. Takenaka T., Nagata H., and Hiruma Y. Jpn. J. Appl. Phys. 5 (2008) 3787
4. Birol H., Damjanovic D., and Setter N. J. Eur. Ceram. Soc. 26 (2006) 861
5. Hansu B., Dragan D., and Nava S. J. Eur. Ceram. Soc. 26 (2006) 861
6. Zhang S.J., Xia R., Shrout T.R., Zang G.Z., and Wang J.F. Solid State Commun. 141 (2007) 675
7. Kim M.S., Lee D.S., Park E.C., Jeong S.J., and Song J.S. J. Eur. Ceram. Soc. 27 (2007) 4121
8. Higashide K., Kakimoto K.I., and Ohsato H.S. J. Eur. Ceram. Soc. 27 (2007) 4107
9. Chang R.C., Chua S.Y., Wong Y.P., Lin Y.F., and Hong C.S. Sens. Actuators A 136 (2007) 267
10. Zhang S.J., Xia R., Shrout T.R., Zang G.Z., and Wang J.F. J. Appl. Phys. 100 (2006) 104108
11. Bomlai P., Sukprasert S., and Steven S.M. J. Mater. Sci. 43 (2008) 6116
12. Zuo R.Z., Ye C., and Fang X.S. J. Phys. Chem. Solids 69 (2008) 230
13. Mahesh Kumar M., Palkara V.R., Srinivas K., and Suryanarayana S.V. Appl. Phys. Lett. 76 (2000) 2764
14. Wang J., Neaton J.B., Zheng H., Nagarajan V., Ogale S.B., Liu B., Vichland D., Vaithyanathan V., Schlom D.G., Waghmare U.V., Spaldin N.A., Rabc K.M., Wutting M., and Ramesh R. Science 299 (2003) 1719
15. Cheng J.R., Meng Z.Y., and Cross L.E. J. Appl. Phys. 98 (2005) 084102
16. Comyn T.P., Mcbride S.P., and Bell A. J. Mater. Lett. 58 (2004) 3844
17. Qi X.D., Dho J., Tomov R., Blamire M.G., and Macmanus-Driscoll J.L. Appl. Phys. Lett. 86 (2005) 062903
18. Nagata H., Koizumi N., and Takenaka T. Key Eng. Mater. 37 (1999) 169
19. Jiang M.H., Liu X.Y., and Chen G.H. Scripta Mater. 60 (2009) 909