Broadband X-ray full field microscopy at a superbend

Journal of Physics: Conference Series

Volumn 186, Issue , 2009, Pages

  Stampanoni, M ^a,b   Marone, F ^a   Mikuljan, G ^a   Jefimovs, K ^c   Trtik, P ^c   Vila Comamala, J ^a   David, C ^a   Abela, R ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ETH ZURICH   (Switzerland)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 73349141164     PISSN: 17426588     EISSN: 17426596     Source Type: Journal    
DOI: 10.1088/1742-6596/186/1/012018     Document Type: Conference Paper

References (4)

1. Meyer-Ilse W, Hamamoto D, Nair A, Lelievre SA, Denbeaux G, Johnson L, Pearson AL, Yager D, LeGros MA, Larabell 2001 High resolution protein localization using soft X-ray microscopy J. Microscopy 201 395-403
2. Born M and Wolf E 1999 Principles of Optics 7th ed. (Cambridge University Press) p 595
3. Jefimovs K, Vila-Comamala J, Stampanoni M, Kaulich B, David C 2008 Beam-shaping condenser lenses for full-field transmission X-ray microscopy J. Synchrotron Radiation 15 106-108
4. Jefimovs K, Bunk O, Pfeiffer F, Grolimund D, van der Veen J F, David C 2007 Fabrication of Fresnel zone plates for hard x-rays Microelectronic Eng. 84 1467-1470