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Volumn 75, Issue 1, 2010, Pages 479-485
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Electrical and optical properties of copper and nickel molecular materials with tetrabenzo [b,f,j,n] [1,5,9,13] tetraazacyclohexadecine thin films grown by the vacuum thermal evaporation technique
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Author keywords
Electrical properties; Optical properties; Organic semiconductors; Thin films
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Indexed keywords
ABSORPTION COEFFICIENTS;
CORNING GLASS;
CRYSTALLINE SILICON WAFERS;
EFFECT OF TEMPERATURE;
ELECTRICAL AND OPTICAL PROPERTIES;
ELECTRICAL PROPERTIES;
ELECTRICAL PROPERTY;
FTIR;
INTER-BAND TRANSITION;
IR SPECTROSCOPY;
MOLECULAR BONDS;
MOLECULAR MATERIALS;
ORGANIC SEMICONDUCTOR;
TEMPERATURE DEPENDENT;
VACUUM THERMAL EVAPORATION;
ATOMIC FORCE MICROSCOPY;
ATOMIC SPECTROSCOPY;
ELECTRIC PROPERTIES;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
NICKEL;
NICKEL ALLOYS;
NICKEL COMPOUNDS;
OPTICAL PROPERTIES;
SEMICONDUCTING FILMS;
SEMICONDUCTING GLASS;
SEMICONDUCTING ORGANIC COMPOUNDS;
SEMICONDUCTING SILICON;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
THIN FILMS;
VACUUM;
VACUUM EVAPORATION;
VAPORS;
THERMAL EVAPORATION;
2,6-DIHYDROXYANTHRAQUINONE;
ANTHRAFLAVIC ACID;
ANTHRAQUINONE DERIVATIVE;
COPPER;
CYCLOHEXANE DERIVATIVE;
HETEROCYCLIC COMPOUND;
NICKEL;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
CHEMISTRY;
ELECTROCHEMISTRY;
INFRARED SPECTROPHOTOMETRY;
METHODOLOGY;
SURFACE PROPERTY;
ULTRAVIOLET SPECTROPHOTOMETRY;
ANTHRAQUINONES;
AZA COMPOUNDS;
COPPER;
CYCLOHEXANES;
ELECTROCHEMISTRY;
MICROSCOPY, ATOMIC FORCE;
MOLECULAR STRUCTURE;
NICKEL;
SPECTROPHOTOMETRY, INFRARED;
SPECTROPHOTOMETRY, ULTRAVIOLET;
SURFACE PROPERTIES;
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EID: 73349130736
PISSN: 13861425
EISSN: None
Source Type: Journal
DOI: 10.1016/j.saa.2009.11.013 Document Type: Article |
Times cited : (9)
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References (26)
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