Test input reduction for result inspection to facilitate fault localization

Automated Software Engineering

Volumn 17, Issue 1, 2010, Pages 5-31

  Hao, Dan ^a   Xie, Tao ^b   Zhang, Lu ^a   Wang, Xiaoyin ^a   Sun, Jiasu ^a   Mei, Hong ^a  

^a Peking University   (China)

^b North Carolina State University   (United States)

Author keywords

Debugging; Fault localization; Test suite reduction; Testing

Indexed keywords

CAPTURE/REPLAY; EXECUTION TRACE; FAULT LOCALIZATION; GENERATION TOOLS; REDUCTION STRATEGY; SIEMENS; TEST COLLECTION; TEST INPUTS; TEST RUNS; TEST SUITE REDUCTION;

INSPECTION;

TESTING;

EID: 73349102487     PISSN: 09288910     EISSN: 15737535     Source Type: Journal    
DOI: 10.1007/s10515-009-0056-x     Document Type: Conference Paper

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