Structural analysis on organic thin-film transistor with device simulation

IEEE Transactions on Electron Devices

Volumn 57, Issue 1, 2010, Pages 195-200

  Shim, Chang Hoon ^a   Maruoka, Fumito ^a   Hattori, Reiji ^a  

^a KYUSHU UNIVERSITY   (Japan)

Author keywords

Contact resistance; Device simulation; Organic thin film transistor (OTFT); Planar structure; Staggered structure

Indexed keywords

CHARACTERISTIC DIFFERENCE; CURRENT FLOWS; DEVICE SIMULATIONS; FIELD-EFFECT MOBILITIES; ORGANIC THIN FILM TRANSISTORS; PLANAR STRUCTURE; SCHOTTKY BARRIER CONTACTS; SIMULATION RESULT;

CHEMICAL SENSORS; CONTACT RESISTANCE; SCHOTTKY BARRIER DIODES; SEMICONDUCTING ORGANIC COMPOUNDS; STRUCTURAL ANALYSIS;

THIN FILM TRANSISTORS;

EID: 73349086857     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2009.2035540     Document Type: Article

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