Efficient methods for large resistor networks

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 29, Issue 1, 2010, Pages 28-39

  Rommes, Joost ^a   Schilders, Wil H A ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Approximate minimum degree; Cholesky decomposition; Electro static discharge analysis; Graph algorithms; Large scale systems; Model order reduction; Parasitic extraction; Path resistance; Resistor networks; Strongly connected components; Two connected components

Indexed keywords

CHOLESKY DECOMPOSITION; CONNECTED COMPONENT; GRAPH ALGORITHMS; MINIMUM DEGREE; PARASITIC EXTRACTION; PATH RESISTANCE; RESISTOR NETWORK; STRONGLY CONNECTED COMPONENT;

ALGORITHMS; COMPUTATIONAL EFFICIENCY; DYNAMICS; LARGE SCALE SYSTEMS; METAL RECOVERY; RESISTORS;

COMPUTER SIMULATION;

EID: 73249123053     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2009.2034402     Document Type: Article

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