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Volumn , Issue , 2006, Pages 230-241

An Approach to the Development of Tolerance Systems for Micro-and Nanotechnology

Author keywords

Calibration; Development of tolerance systems for micro and nanotechnology; Instrumentation; Machining experiments; Methods; Nanoscale calibration standards; Tolerancing and standards

Indexed keywords


EID: 73149091342     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/3527606661.ch17     Document Type: Chapter
Times cited : (1)

References (9)
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  • 2
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    • Functional and depth oriented characterisation of technical surfaces
    • in Proceedings of the 1st Euspen Topical Conference on Fabrication and Metrology in Nanotechnolgy, Copenhagen, May 28-30, 2000 (Center for Geometrical Metrology, Lyngby, DK
    • E. Westkämper and M. H.R. Kraus, Functional and depth oriented characterisation of technical surfaces, in Proceedings of the 1st Euspen Topical Conference on Fabrication and Metrology in Nanotechnolgy, Copenhagen, May 28-30, 2000 (Center for Geometrical Metrology, Lyngby, DK, 2000).
    • (2000)
    • Westkämper, E.1    Kraus, M.H.R.2
  • 3
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  • 4
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    • Image Metrology ApS
    • SPIP-The Scanning Probe Image Processor, Lyngby, Denmark
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  • 5
    • 0004033627 scopus 로고    scopus 로고
    • Geometrical Product Specifications (GPS)-Surface texture: Profile method
    • ISO 5436-1, Measurement standards-Part 1: Material measures
    • ISO 5436-1, Geometrical Product Specifications (GPS)-Surface texture: Profile method; Measurement standards-Part 1: Material measures, 2000.
    • (2000)
  • 6
    • 84889615671 scopus 로고    scopus 로고
    • Judgement of the profile of nano-roughness standard specimens by different contacting and non contacting methods
    • in Proceedings of the NanoScale 2004, Braunschweig, Germany, March 25-26
    • R. Krüger-Sehm et al., Judgement of the profile of nano-roughness standard specimens by different contacting and non contacting methods, in Proceedings of the NanoScale 2004, Braunschweig, Germany, March 25-26, 2004.
    • (2004)
    • Krüger-Sehm, R.1
  • 7
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    • Roughness parameters of surfaces by atomic force microscopy
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    • (1995) Ann. CIRP , vol.44 , Issue.1 , pp. 517-522
    • Carneiro, K.1
  • 8
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    • Geometrical Product Specifications (GPS)-Surface texture: Profile method; Surfaces having stratified functional properties-Part 2: Height Characterization using the linear material ratio curve
    • ISO 13565-2
    • ISO 13565-2, Geometrical Product Specifications (GPS)-Surface texture: Profile method; Surfaces having stratified functional properties-Part 2: Height Characterization using the linear material ratio curve, 1996.
    • (1996)
  • 9
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    • Function-oriented lapping and polishing of ceramic rolling elements through characterization of the workpiece surface
    • E. Westkämper and H.-W. Hoffmeister, Function-oriented lapping and polishing of ceramic rolling elements through characterization of the workpiece surface, Ann. CIRP 45 (1), 529-532 (1996).
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    • Westkämper, E.1    Hoffmeister, H.-W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.