Seafloor roughness measured by a laser line scanner and a conductivity probe

IEEE Journal of Oceanic Engineering

Volumn 34, Issue 4, 2009, Pages 459-465

  Wang, Chau Chang ^a   Tang, Dajun ^b  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Conductivity probe; Laser line scanning; Seafloor backscattering; Seafloor roughness

Indexed keywords

ACOUSTIC BACKSCATTER; BOTTOM ROUGHNESS; CONDUCTIVITY PROBE; GRID POINTS; HIGH FREQUENCY HF; HORIZONTAL SPACING; IN-SITU MEASUREMENT; LASER LINE SCANNER; LASER SCANNER; LASER SCANNING; LASER SCANS; NEW JERSEY; ROUGHNESS SPECTRUM; SEA FLOOR; SEAFLOOR BACKSCATTERING; SPATIAL HETEROGENEITY; SPECTRAL LINE; VERTICAL DIRECTION; WATER TURBIDITY; WAVE NUMBERS;

ACOUSTIC VARIABLES MEASUREMENT; ACOUSTIC WAVE BACKSCATTERING; ACOUSTICS; LASER APPLICATIONS; PROBES; SPECTROSCOPY; TURBIDITY;

SCANNING;

EID: 73049090439     PISSN: 03649059     EISSN: None     Source Type: Journal    
DOI: 10.1109/JOE.2009.2026986     Document Type: Article

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