Characterization of interface roughness of rippled sand off fort Walton Beach, Florida

IEEE Journal of Oceanic Engineering

Volumn 27, Issue 3, 2002, Pages 505-514

  Briggs, Kevin B ^a   Tang, Dajun ^b   Williams, Kevin L ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

Conductivity; Seafloor roughness; Sediments

Indexed keywords

ACOUSTIC WAVE SCATTERING; ELECTRIC CONDUCTIVITY; PHOTOGRAMMETRY; PHOTOGRAPHY; SURFACE ROUGHNESS;

ACOUSTIC BOTTOM SCATTERING;

OCEAN ENGINEERING;

EID: 0036661642     PISSN: 03649059     EISSN: None     Source Type: Journal    
DOI: 10.1109/JOE.2002.1040934     Document Type: Article

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