Enhanced lattice-based Adaptive Random Testing

Proceedings of the ACM Symposium on Applied Computing

Volumn , Issue , 2009, Pages 422-429

  Chen, T Y ^a   Huang, De Hao ^a   Kuo, F C ^a   Merkel, R G ^a   Mayer, Johannes ^b  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADAPTIVE RANDOM TESTING; GENERATION COST; HIGH DENSITY; LATTICE NODES; LOW DENSITY; RANDOM TESTING; REGION LOCATION; SKEWED DISTRIBUTION; TEST CASE; TEST CASE DISTRIBUTION;

COMPUTER SCIENCE; TESTING; VIBRATION MEASUREMENT;

FAULT DETECTION;

EID: 72949121677     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1529282.1529376     Document Type: Conference Paper

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