FTIR sensitivity enhancement on Pt/SiO2/Au layered structures: A novel method for CO adsorption studies on Pt surfaces

Surface Science

Volumn 604, Issue 2, 2010, Pages 79-83

  Deshlahra, P ^a   Tiwari, B ^a   Bernstein, G H ^a   Ocola, L E ^b   Wolf, E E ^a  

^a University of Notre Dame   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

CO chemisorption; Model catalysts; Pt thin film; Reflectance infrared spectroscopy

Indexed keywords

ABSORPTION WAVELENGTHS; CATALYTIC SURFACES; CO ADSORPTION; CO CHEMISORPTION; FTIR; GOLD FILM; INFRARED WAVELENGTHS; LAYERED STRUCTURES; MODEL CATALYSTS; NOVEL METHODS; OPTICAL INTERFERENCE EFFECTS; PEAK HEIGHT; PLATINUM FILMS; PT NANOWIRES; PT THIN FILM; PT THIN FILMS; R VALUE; REACTION CONDITIONS; SENSITIVITY ENHANCEMENTS; SPECULAR REFLECTANCE; SURFACE AREA; TIO;

ABSORPTION; ADSORPTION; ATMOSPHERIC PRESSURE; CARBON MONOXIDE; CATALYSIS; CATALYSTS; CHEMISORPTION; DEPOSITION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GOLD DEPOSITS; PLATINUM; REFLECTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES; SILICON WAFERS; THIN FILM DEVICES; THIN FILMS;

GOLD;

EID: 72649091437     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2009.10.011     Document Type: Article

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