Resonance Raman spectroscopy in Si and C ion-implanted double-wall carbon nanotubes

Physical Review B - Condensed Matter and Materials Physics

Volumn 80, Issue 15, 2009, Pages

  Saraiva, G D ^a   Souza Filho, A G ^b   Braunstein, G ^c   Barros, E B ^b   Mendes Filho, J ^b   Moreira, E C ^d   Fagan, S B ^e   Baptista, D L ^f   Kim, Y A ^g   Muramatsu, H ^g   Endo, M ^g   Dresselhaus, M S ^h  

^a STATE UNIVERSITY OF CEARÁ   (Brazil)

^b FEDERAL UNIVERSITY OF CEARÁ   (Brazil)

^c MICRON TECHNOLOGY INC   (United States)

^d UNIVERSIDADE FEDERAL DO PAMPA   (Brazil)

^e CENTRO UNIVERSITÁRIO FRANCISCANO   (Brazil)

^f FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

^g SHINSHU UNIVERSITY   (Japan)

^h Department of Electrical Engineering and Computer Science   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 72449123849     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.80.155452     Document Type: Article

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