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Volumn 78, Issue 4, 2004, Pages 333-361

Accurate quantification of melt inclusion chemistry by LA-ICPMS: A comparison with EMP and SIMS and advantages and possible limitations of these methods

Author keywords

Analytical accuracy; Crystallized melt inclusions; Inductively coupled plasma mass spectrometry; Secondary ion mass spectrometry

Indexed keywords

CHEMICAL ANALYSIS; COMPARATIVE STUDY; ELECTRON PROBE ANALYSIS; GEOCHEMISTRY; INDUCTIVELY COUPLED PLASMA METHOD; ION MICROPROBE; MELT INCLUSION;

EID: 7244239419     PISSN: 00244937     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.lithos.2004.06.011     Document Type: Article
Times cited : (105)

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