Reusing component test cases for integration testing of retarding embedded system components

1st International Conference on Advances in System Testing and Validation Lifecycle, VALID 2009

Volumn , Issue , 2009, Pages 1-6

  Pérez, Abel Marrero ^a   Kaiser, Stefan ^a  

^a TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Embedded systems; Test case reuse; Test event synchronization; Test levels

Indexed keywords

EVENT SYNCHRONIZATION; INTEGRATION TESTING; LARGE DELAYS; MULTI-LEVEL; TEST CASE; TEST EVALUATION; TEST EVENT SYNCHRONIZATION; TEST EXECUTION;

EMBEDDED SYSTEMS; SYSTEM THEORY;

TESTING;

EID: 72349090453     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VALID.2009.19     Document Type: Conference Paper

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