New fully differential instrumental chain for hall sensor signal conditioning integrated in standard 0.35 μm CMOS process

2009 Joint IEEE North-East Workshop on Circuits and Systems and TAISA Conference, NEWCAS-TAISA '09

Volumn , Issue , 2009, Pages

  Ouffoue, Cyrius ^a   Frick, Vincent ^a   Kern, Christian ^b   Hébrard, Luc ^a  

^a Faculté de Médecine   (France)

^b Groupe Socomec   (France)

Author keywords

[No Author keywords available]

Indexed keywords

1/F NOISE; CMOS PROCESSS; FULLY DIFFERENTIAL; HALL DEVICES; HALL SENSOR; HIGH-PASS; INSTRUMENTATION AMPLIFIER; MODULATION-DEMODULATION; SPINNING CURRENT;

CHOPPER AMPLIFIERS; HALL EFFECT TRANSDUCERS; MAGNETIC FIELDS;

MAGNETIC FIELD MEASUREMENT;

EID: 72249114697     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/NEWCAS.2009.5290418     Document Type: Conference Paper

References (7)

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