-
1
-
-
0012247651
-
A new family of mesoporous molecular sieves prepared with liquid crystal templates
-
Beck J.S., Vartuli J.C., Roth W.J., Leonowicz M.E., Kresge C.T., Schmitt K.D., Chu C.T.-W., Olson D.H., Sheppard E.W., McCullen S.B., Higgins J.B., and Schlenker J.L. A new family of mesoporous molecular sieves prepared with liquid crystal templates. J. Am. Chem. Soc. 114 (1992) 10834-10843
-
(1992)
J. Am. Chem. Soc.
, vol.114
, pp. 10834-10843
-
-
Beck, J.S.1
Vartuli, J.C.2
Roth, W.J.3
Leonowicz, M.E.4
Kresge, C.T.5
Schmitt, K.D.6
Chu, C.T.-W.7
Olson, D.H.8
Sheppard, E.W.9
McCullen, S.B.10
Higgins, J.B.11
Schlenker, J.L.12
-
2
-
-
0001266782
-
Mesoporous silica molecular sieves prepared by ionic and neutral surfactant templating: a comparison of physical properties
-
Tanev P.T., and Pinnavaia T.J. Mesoporous silica molecular sieves prepared by ionic and neutral surfactant templating: a comparison of physical properties. Chem. Mater. 8 (1996) 2068-2079
-
(1996)
Chem. Mater.
, vol.8
, pp. 2068-2079
-
-
Tanev, P.T.1
Pinnavaia, T.J.2
-
3
-
-
60949094543
-
The radical species and impurities present in mesoporous silicas as oxidation active centres
-
Trejda M., Ziolek M., Decyk P., and Duczmal D. The radical species and impurities present in mesoporous silicas as oxidation active centres. Micropor. Mesopor. Mater. 120 (2009) 214-220
-
(2009)
Micropor. Mesopor. Mater.
, vol.120
, pp. 214-220
-
-
Trejda, M.1
Ziolek, M.2
Decyk, P.3
Duczmal, D.4
-
5
-
-
0032769438
-
Time-of-flight secondary ion mass spectrometry of industrial materials
-
Keller B.A., and Hug P. Time-of-flight secondary ion mass spectrometry of industrial materials. Anal. Chim. Acta 393 (1999) 201-212
-
(1999)
Anal. Chim. Acta
, vol.393
, pp. 201-212
-
-
Keller, B.A.1
Hug, P.2
-
6
-
-
16244363702
-
The magic of cluster SIMS
-
Winograd N. The magic of cluster SIMS. Anal. Chem. 77 7 (2005) 142A-149A
-
(2005)
Anal. Chem.
, vol.77
, Issue.7
-
-
Winograd, N.1
-
8
-
-
33846041086
-
Surface properties of platinum catalysts based on various nanoporous matrices
-
Sobczak I., Grams J., and Ziółek M. Surface properties of platinum catalysts based on various nanoporous matrices. Micropor. Mesopor. Mater. 99 (2007) 345-354
-
(2007)
Micropor. Mesopor. Mater.
, vol.99
, pp. 345-354
-
-
Sobczak, I.1
Grams, J.2
Ziółek, M.3
-
10
-
-
34548486660
-
Time-of-flight secondary ion mass spectrometry as a new technique for the investigations of the deactivation process of hydrodechlorination catalysts
-
Grams J., Góralski J., and Szczepaniak B. Time-of-flight secondary ion mass spectrometry as a new technique for the investigations of the deactivation process of hydrodechlorination catalysts. Russ. J. Phys. Chem. 81 9 (2007) 1515-1520
-
(2007)
Russ. J. Phys. Chem.
, vol.81
, Issue.9
, pp. 1515-1520
-
-
Grams, J.1
Góralski, J.2
Szczepaniak, B.3
-
11
-
-
33846048054
-
Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigations of metal/support catalysts
-
Norris C.P. (Ed), Nova Science Publishers Inc., New York
-
Grams J., and Szynkowska M.I. Applications of time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigations of metal/support catalysts. In: Norris C.P. (Ed). Focus on Surface Science Research (2005), Nova Science Publishers Inc., New York 71-99
-
(2005)
Focus on Surface Science Research
, pp. 71-99
-
-
Grams, J.1
Szynkowska, M.I.2
-
12
-
-
0003776074
-
-
John Wiley and Sons, New York
-
Benninghoven A., Rüdenauer F.G., and Werner H.W. Secondary Ion Mass Spectrometry. Basic Concepts, Instrumental Aspects, Applications and Trends (1987), John Wiley and Sons, New York
-
(1987)
Secondary Ion Mass Spectrometry. Basic Concepts, Instrumental Aspects, Applications and Trends
-
-
Benninghoven, A.1
Rüdenauer, F.G.2
Werner, H.W.3
-
13
-
-
0003698311
-
-
Principles and Applications, Clarendon, Oxford
-
Vickerman J.C., Brown A., and Reed N.M. Secondary Ion Mass Spectrometry (1989), Principles and Applications, Clarendon, Oxford
-
(1989)
Secondary Ion Mass Spectrometry
-
-
Vickerman, J.C.1
Brown, A.2
Reed, N.M.3
-
14
-
-
21244462514
-
Chemical analysis of inorganic and organic surfaces and thin films by static time-of-flight secondary ion mass spectrometry (TOF-SIMS)
-
Benninghoven A. Chemical analysis of inorganic and organic surfaces and thin films by static time-of-flight secondary ion mass spectrometry (TOF-SIMS). Angew. Chem. Int. Ed. Engl. 33 (1994) 1023-1043
-
(1994)
Angew. Chem. Int. Ed. Engl.
, vol.33
, pp. 1023-1043
-
-
Benninghoven, A.1
-
15
-
-
33845938276
-
The role of chlorine in the generation of catalytic active species located in Au-containing MCM-41 materials
-
Sobczak I., Kusior A., Grams J., and Ziółek M. The role of chlorine in the generation of catalytic active species located in Au-containing MCM-41 materials. J. Catal. 245 (2007) 259-266
-
(2007)
J. Catal.
, vol.245
, pp. 259-266
-
-
Sobczak, I.1
Kusior, A.2
Grams, J.3
Ziółek, M.4
-
17
-
-
15544388800
-
Direct evidence of oxidized gold on supported gold catalysts
-
Fu L., Wu N.Q., Yang J.H., Qu F., Johnson D.L., Kung M.C., Kung H.H., and Dravid V.P. Direct evidence of oxidized gold on supported gold catalysts. J. Phys. Chem. B 109 9 (2005) 3704-3706
-
(2005)
J. Phys. Chem. B
, vol.109
, Issue.9
, pp. 3704-3706
-
-
Fu, L.1
Wu, N.Q.2
Yang, J.H.3
Qu, F.4
Johnson, D.L.5
Kung, M.C.6
Kung, H.H.7
Dravid, V.P.8
-
18
-
-
2942594079
-
Cluster primary ion bombardment of organic materials
-
Kollmer F. Cluster primary ion bombardment of organic materials. Appl. Surf. Sci. 231-232 (2004) 153-158
-
(2004)
Appl. Surf. Sci.
, vol.231-232
, pp. 153-158
-
-
Kollmer, F.1
-
19
-
-
25144498383
-
Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source
-
Touboul D., Kollmer F., Niehuis E., Brunelle A., and Laprévote O. Improvement of biological time-of-flight-secondary ion mass spectrometry imaging with a bismuth cluster ion source. J. Am. Soc. Mass Spectrom. 16 (2005) 1608-1618
-
(2005)
J. Am. Soc. Mass Spectrom.
, vol.16
, pp. 1608-1618
-
-
Touboul, D.1
Kollmer, F.2
Niehuis, E.3
Brunelle, A.4
Laprévote, O.5
|