Ensuring quality of shared keys through quantum key distribution for practical application

IEEE Journal on Selected Topics in Quantum Electronics

Volumn 15, Issue 6, 2009, Pages 1622-1629

  Tanaka, Akihiro ^a   Maeda, Wakako ^a   Takahashi, Seigo ^a   Tajima, Akio ^a   Tomita, Akihisa ^a,b  

^a NEC CORPORATION   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Error rate; Quantum key distribution (QKD); Randomness test

Indexed keywords

DEGRADING FACTORS; ERROR RATE; PRIVACY AMPLIFICATION; QUANTUM CRYPTOSYSTEMS; QUANTUM KEY DISTRIBUTION; RANDOMNESS TEST;

AMPLIFICATION; KEYS (FOR LOCKS); QUANTUM CHEMISTRY; SIGNAL FILTERING AND PREDICTION;

QUANTUM CRYPTOGRAPHY;

EID: 72149133647     PISSN: 1077260X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSTQE.2009.2028243     Document Type: Article

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