Growth and morphology of thin Fe films on flat and vicinal Au(111): A comparative study

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Allmers, T ^a   Donath, M ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AU(1 1 1 ); COMPARATIVE STUDIES; CRITICAL FILM THICKNESS; CRYSTALLOGRAPHIC DIRECTIONS; GROWTH DIRECTIONS; HEXAGONAL SYMMETRY; PSEUDOMORPHIC GROWTH; SCANNING TUNNELING MICROSCOPY (STM); STEP EDGE; SUBSTRATE SURFACE; THIN FE FILMS; TWOFOLD SYMMETRY;

CRYSTALLITES; EPITAXIAL GROWTH; FILM GROWTH; GOLD; HETEROJUNCTION BIPOLAR TRANSISTORS; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS;

PHASE TRANSITIONS;

EID: 72149129737     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/10/103049     Document Type: Article

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